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One of the major driving forces for the continuing rapid
development in the information and communication fields is
in electronic devices: The foundation of this dynamic
progress and development is the alacritous miniaturisation
of semiconductor integrated circuits. It has been forecast
that by the year 2018, interconnect widths will be reduced
to 10 nm – requiring a processing accuracy of 1 nm and hence
a measuring accuracy of 0.1 nm, therefore this rapid
miniaturisation, if it is to continue unabated, will require
a similarly rapid improvement in the spatial resolution of
measurement and characterisation. Presently, Scanning Probe Microscopy (SPM)
is the only tool which enables true atomic scale resolution
and hence its role is becoming progressively important in
the face of continued diminution
The 2nd Singapore SPM Symposium (SingSPM 2008) will provide an international forum for discussion of the latest developments in nanoscale science and technology as well as highlighting recent advances in scanning probe microscopy (SPM). This year we are incorporating industrial applications of SPM, technology licensing and related Singapore government policies and programmes. The programme will include plenary talks from SPRING Singapore, Exploit Technologies Singapore, Cientifica Ltd, IMRE and NUS.
2nd SingSPM 2008
8 May - 9 May 2008
Matrix Building, Level 4, Biopolis, Singapore
For programme and details, please click
here.
For registration, please go to
www.imre.a-star.edu.sg/events-register/singspm2008
 SingSPM 2008 is set to fulfil two primary objectives. The first objective is to strengthen the scientific community working on SPM-related research including SPM instrumentation development, advanced surface characterisation, and probing of surfaces and interfaces. The second objective is to build a platform for dialogue between the scientific community and industrial partners. Stronger ties with industry and mutual understanding of needs and challenges would result in possible R&D collaborations between A*STAR research institutes and companies interested in developing their expertise in nanoscale characterisation techniques.
We are also pleased to announce the inauguration of the Singapore SPM Forum - an online meeting place for the SPM community in Singapore and S.E. Asia. Conference attendees will automatically be registered for the forum. Further details will be forthcoming soon.
For more information on scanning probe microscopy
activity at IMRE, or SingSPM 2008, please contact:
spm@imre.a-star.edu.sg
The 2nd Singapore SPM Symposium (SingSPM 2008) is proudly
organised by:
Main sponsors:
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Sponsors:
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